Zero insertion force test/burn-in socket

Details Zero insertion force test/burn-in socket Zero insertion force test/burn-in socket

1993-03-15

1995-04-25

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

439268, G01R 3102, H01R 1362

Patent

active

054102570

ABSTRACT:
An IC test/burn-in socket with spring cantilever beam contacts and a lid 4 that provides for self-aligning of the IC lead and the socket contacts 6. The lid is actuated from above, and the lid has three positions--one for an unloaded socket, one for holding the contacts apart for insertion of an IC, and the other for releasing the contacts such the the spring force of the cantilever beam contacts make electrical contact with the IC leads. The cantilever contacts are arranged in interdigitated rows. The flat cantilever contacts allow the contacts to spread a substantial distance to achieve the desired contact force and will thus accommodate a wider range of IC lead thicknesses and, so, be more forgiving than earlier designs. There is a lid with troughs to guide the contacts and a through hole whereby an IC is inserted. The troughs and through hole provide improved registration of IC lead to socket contacts. The lid is accessed from above to enhance automatic operation and to reduce the footprint or space taken by the socket on a PCB.

REFERENCES:
patent: 3848221 (1974-11-01), Lee, Jr.
patent: 4080032 (1978-03-01), Cherian et al.
patent: 4350402 (1982-09-01), Douty et al.
patent: 5213531 (1993-05-01), Matsuoka et al.

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