Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1990-06-04
1991-07-09
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324602, 324649, G01R 2708
Patent
active
050309196
ABSTRACT:
In a switchable impedance tester for measuring very small impedances, the effect of switch impedances is eliminated by connecting the test load between two switching transistors in their emitter-collector circuit, and driving them with operational amplifiers arranged to urge their inputs into equality. A test voltage source is connected across first inputs of the amplifiers, and the other inputs are connected between the respective transistors and the load. This produces an operational condition in which the voltage across the load is independent of the parameters of the switching transistors, i.e. the switching transistors appear to have zero impedance.
REFERENCES:
patent: 3449666 (1969-06-01), Plice
patent: 4242631 (1980-12-01), Hall
patent: 4634975 (1987-01-01), Eccleston et al.
patent: 4961051 (1990-10-01), Tjebben
Collier Edward J.
Freuler George H.
Wasemiller George J.
G&E Test Technologies, Inc.
Mueller Robert W.
Peterson Gordon L.
Weissenberger Harry G.
Wieder Kenneth A.
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