Chemistry of inorganic compounds – Zeolite – Organic compound used to form zeolite
Patent
1997-10-07
2000-06-20
Bell, Mark L.
Chemistry of inorganic compounds
Zeolite
Organic compound used to form zeolite
423705, 423706, 423707, 423709, 423718, C01B 3946
Patent
active
060774983
DESCRIPTION:
BRIEF SUMMARY
FIELD OF THE ART
Crystalline microporous materials
BACKGROUNDS
The zeolites are microporous crystalline materials of variable composition, characterized by a crystal lattice of TO.sub.4 tetrahedrons (where T represents atoms with formal oxidation status of +3 or +4, as for example Si, Ti, Al, Ge, B, Ga, . . . ) that share all their vertexes causing a tridimensional structure which contains channels and/or cavities of molecular dimentions. When any of the T atoms present an oxidation status smaller than +4, the crystal lattice which is formed, presents negative charges which are compensated by means of the presence in the channels or cavities of organic or inorganic cations. In said channels and cavities, organic and H.sub.2 O molecules may also be housed, due to which, in general, the chemical composition of the zeolites may be represented by means of the following empirical formula: one or various trivalent elements; Y is one or various tetravalent elements, generally Si; and R is one or various organic substances. Though the nature of M, X, Y and R and the values of x, y, z, and w may, in general, be varied by means of postsynthesis treatments, the chemical composition of a zeolite (as synthetized or after its roasting) possesses a characteristic range of each zeolite and of its method of obtention.
On the other hand, a zeolite is also characterized by its crystalline structure, which defines a system of channels and cavities and which cause a diffraction pattern of specific X-rays. In this manner, the zeolites are differentiated from each other by their chemical composition range plus their X ray diffraction pattern. Both characteristics (crystalline structure and chemical composition) also determine the physio-chemical properties of each zeolite and their applicability in different industrial processes.
DESCRIPTION OF THE INVENTION
The present invention relates to a crystalline microporous material of zeolitic nature, called ITQ-1, to its method of obtention and to its applications.
Such a material is characterized by its chemical composition and by its X ray difraction pattern. In its anhydrous and roasted form, the chemical composotion of ITQ-1 may be represented by means of the empirical formula value smaller than 0.04, and may likewise equal zero; M is H+ or an inorganic cation with charge +n; X is a chemical element with oxidation status +3 (as, for example, Al, Ga, B, Cr) and Y is a chemical element with oxidation status +4 (as for example, Ti, Ge, V). When x=0 and y=0, the material may be described as a new polymorphe form of silica (SiO.sub.2) characterized by its microporous character. In a preferred embodiment of the present invention, ITQ-1 has the composition, in roasted and anhydrous stage and may equal zero, in which case, the material may be described by means of the formula SiO.sub.2. However, depending on the method of synthesis and on its roasting or subsequent treatments, the existance of defects in the crystal lattice is possible, which are manifested by the presence of Si--OH groups (silanoles). Said defects have not been included in the previous empirical formulas.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 Diffraction pattern of ITQ-1.
FIG. 2 Diffraction patter as a result of roasting.
The X ray diffraction pattern of ITQ-1, such as is synthesized, obtained by the powder method using a variable slit of divergence (constant irradiated area), is characterized by the following interplanar spaced values (d) and relative intensities (I/I.sub.o):
TABLE I ______________________________________
d (A)
I/I.sub.o (%)
______________________________________
26.8 25
13.5 40
12.1 20
11.1 10
9.17 10
7.33 5
6.85 10
6.31 5
5.98 20
5.62 15
5.49 10
4.64 50
4.55 60
4.42 35
4.11 20
3.94 100
3.84 45
3.75 20
3.55 40
3.41 90
3.31 65
3.09 20
3.05 20
2.92 5
2.82 15
2.69 10
2.62 5
______________________________________
Such a diffraction pattern is represented in FIG. 1 (Ku radiation of Cu). The relativ
REFERENCES:
patent: 4439409 (1984-03-01), Puppe et al.
patent: 4826667 (1989-05-01), Zones et al.
patent: 4954325 (1990-09-01), Rubin et al.
patent: 5236575 (1993-08-01), Bennett et al.
patent: 5362697 (1994-11-01), Fung et al.
Camblor Fernandez Miguel Angel
Canos Avelino Corma
Corell Martires Catalina
Diaz Cabanas Maria Jose
Bell Mark L.
Consejo Superior Investigaciones Cientificas
Sample David
Universidad Politecnica de Valencia
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