Zener-zap memory

Electricity: electrical systems and devices – Safety and protection of systems and devices – With specific voltage responsive fault sensor

Reexamination Certificate

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Reexamination Certificate

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07417839

ABSTRACT:
In an integrated circuit for electrically permanently program information in the integrated circuit a current is driven through an NPN-transistor. The integrated circuit has a first current feeding circuit having an output connected via a resistor to the NPN-transistor, a feeding point connectable to a feeding voltage, and a control input for controlling the programming of the NPN-transistor. The integrated circuit also has at least a second current feeding circuit having an output connected to the feeding point for the first current feeding circuit, a feeding point connectable to a feeding voltage, and a control input for controlling the programming of the NPN-transistor. Finally the integrated circuit has a first voltage level controller provided to split the voltage needed to program the NPN-transistor over the first and at least second current feeding circuit.

REFERENCES:
patent: 5446407 (1995-08-01), Yamamoto
patent: 5572472 (1996-11-01), Kearney et al.
patent: 5619122 (1997-04-01), Kearney et al.
patent: 5796298 (1998-08-01), Kearney et al.
patent: 5856742 (1999-01-01), Vulih et al.
patent: 7145255 (2006-12-01), Lutz et al.
patent: 0 595 629 (1993-10-01), None
patent: 2003-068858 (2003-03-01), None
International Search Report; PCT/SE2004/001557; 1 Pg., Feb. 18, 2005.

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