Optics: measuring and testing – By dispersed light spectroscopy – With background radiation comparison
Patent
1993-11-03
1996-01-16
McGraw, Vincent P.
Optics: measuring and testing
By dispersed light spectroscopy
With background radiation comparison
G01J 336
Patent
active
054852676
ABSTRACT:
A spectrometer using Zeeman background correction is disclosed which has a sample producer (100) for producing a cloud of atoms, an electromagnetic radiation source (102) for irradiating the atom cloud, a detector (104) for detecting the radiation after it passes through the atom cloud and an electromagnet (14) for applying a magnetic field to the atom cloud. A power supply and switching unit (106) for powering the electromagnet and switching the electromagnet on and off to create a Zeeman effect are provided. The switching unit has transistors (16-22, 40, 42, 50, 52) controlled by a control circuit (25), and the power supply includes a rectifier (10) and one or more capacitors (12, 12a, 12b). The switching time is typically on the order of 1-1.5 ms or less and the high voltage which is applied is on the order of 400-800 V.
REFERENCES:
patent: 4341470 (1982-07-01), Parker et al.
Davenport Clive T.
Grey Ronald G.
Huberts John T.
GBC Scientific Equipment Pty. Ltd.
Hantis K. P.
McGraw Vincent P.
LandOfFree
Zeeman effect spectrometer having high-speed electromagnetic swi does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Zeeman effect spectrometer having high-speed electromagnetic swi, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Zeeman effect spectrometer having high-speed electromagnetic swi will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-313511