Zeeman effect atomic absorption spectrometer

Optics: measuring and testing – Range or remote distance finding – With photodetection

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356 96, G01J 330, G01J 342

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active

039375773

ABSTRACT:
An acyclic Zeeman effect atomic absorption spectrometer viewing the sample analyzed continuously and simultaneously with two linear orthogonally polarized radiation beams preselected as to wavelength to effectively cancel out, upon logarithmic ratioing of their electrical analogs, the contribution of adulterants to the mass determination of a trace element in analysis and thereafter obtaining the ratio of the integrated value of the monitored sample logarithmic ratio signal with that of a stored standard sample integrated logarithmic ratio signal as a measure of the concentration of trace element present.

REFERENCES:
patent: 3586441 (1971-06-01), Smith et al.
patent: 3600567 (1971-08-01), Varnela
patent: 3676004 (1972-07-01), Prugger et al.
patent: 3737234 (1973-06-01), Shibata
patent: 3740117 (1973-06-01), Hubby, Jr.
patent: 3752995 (1973-08-01), Liedholz
patent: 3811778 (1974-05-01), Hadeishi
patent: 3843258 (1974-10-01), Shupe
Hadeishi et al., "Hyperfine Zeeman Effect Atomic Absorption Spectrometer for Mercury," Science, Vol. 174, Oct. 22, 1971, pp. 404-407.

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