Boots – shoes – and leggings
Patent
1995-02-23
1995-08-01
Ramirez, Ellis B.
Boots, shoes, and leggings
G06F 1700
Patent
active
054385270
ABSTRACT:
A method for predicting yields for integrated circuit designs for given specification limits and process variations with respect to transistor parametric variations is based on a stastical analysis starting with response surface modeling techniques that relate desired circuit outcomes as a function of a set of defined independent variables. The response surfaces are converted to discrete C.sub.pk surfaces for all combinations of the independent variables. The C.sub.pk surfaces are next converted to discrete percent yield surfaces for each of the circuit outcomes which then are combined to provide a composite yield surface comprising all desired parametric operating points of the outcomes that may be used to predict the circuit yield.
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Hacever et al; "Parametric Yield Optimization For MOS Circuit Blocks"; IEEE CAD 1988.
Alvarez; "Application of Statistical Design and Response Surface Methods to Computer-Aided VLSI device Design"; IEEE CAD 1988.
Feldbaumer David W.
Maass Eric
Atkins Robert D.
Bingham Michael D.
Dover Rennie William
Motorola Inc.
Ramirez Ellis B.
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