Yield patrolling system

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C700S095000, C700S109000, C700S110000, C700S111000, C700S121000

Reexamination Certificate

active

07117057

ABSTRACT:
A yield patrolling system, which monitors production yield of a manufacturing line, has at least one product measurement and test device. The product measurement and test device measures yield determining parameters of product at completion of process steps executed by equipment within the manufacturing line. The system further has a test database in communication with the product measurement and test device to receive and retain the measured yield determining parameters. A statistical calculator is in communication with the test database to receive the measured yield determining parameters. The statistical calculator then calculates from the measured yield determining parameters production yield statistics indicating an amount of the product being fabricated on the manufacturing line. A yield-warning device is in communication with the statistical calculator to receive the production yield statistics and to provide a yield warning alert to a responsible person indicating that the manufacturing line is not fabricating product with a sufficient yield. Further, a yield information interface receives a compilation of the production yield statistics for each process step from the statistical calculator.

REFERENCES:
patent: 5862054 (1999-01-01), Li
patent: 5923553 (1999-07-01), Yi
patent: 5956251 (1999-09-01), Atkinson et al.
patent: 6055463 (2000-04-01), Cheong et al.
patent: 6131052 (2000-10-01), Ban et al.
patent: 6304791 (2001-10-01), Kim
patent: 6408220 (2002-06-01), Nulman
David J. Sheskin et al., The Kruskal-Wallis One-Way Analysis of Variance by Ranks (Nonparametric Test Employed with Ordinal Data), Handbook of Parametric and Nonparametric Statistical Procedures, 2000, 2nd ed., p. 144, Chapman & Hall/CRCUSA.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Yield patrolling system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Yield patrolling system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Yield patrolling system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3647448

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.