Y-jet tip tester

Details Y-jet tip tester Y-jet tip tester

1977-02-17

1978-08-22

Corbin, John K.

Optics: measuring and testing

Angle measuring or angular axial alignment

With photodetection remote from measured angle

356138, 356241, G01B 1100, G01B 1127

Patent

active

041085540

ABSTRACT:
An apparatus for testing the similarity in cross section and the disposition of each relative to a common axis of a plurality of similar bores formed in a burner tip and distributed around the axis.

REFERENCES:
patent: 2146906 (1939-02-01), Muller
patent: 3495915 (1970-02-01), Watson et al.
patent: 3636362 (1972-01-01), Beeman et al.
patent: 3939386 (1976-11-01), Smith
Habegger, M. A., "Optical Determination of Semiconductor Device Edge Profiles," IBM Tech. Disc. Bull. v. 19, 7-76, pp. 474-477.

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