XRF analyzer

Details XRF analyzer XRF analyzer

2007-02-27

2008-09-30

Kiknadze, Irakli (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Fluorescence

C378S042000, C378S102000, C378S156000

Reexamination Certificate

active

07430274

ABSTRACT:
An XRF system, preferably handheld, includes an X-ray source for directing X-rays to a sample, a detector responsive to X-rays emitted by the sample, and a filter assembly with multiple filter materials located between the X-ray source and the detector. An analyzer is responsive to detector and is configured to analyze the intensities of X-rays irradiated by the sample at one power setting and to choose a filter material which suppresses certain intensities with respect to other intensities. A device, controlled by the analyzer, automatically moves the filter assembly to the chosen filter material and then the analyzer increases the power setting to analyze certain non-suppressed intensities.

REFERENCES:
patent: 5204888 (1993-04-01), Tamegai et al.
patent: 6477227 (2002-11-01), Kaiser et al.
patent: 6501825 (2002-12-01), Kaiser et al.
patent: 6850592 (2005-02-01), Schramm et al.
patent: 6909770 (2005-06-01), Schramm et al.

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