“2-step contact” clamping fixture for the...

Details “2-step contact” clamping fixture for the... “2-step contact” clamping fixture for the...

2006-08-01

2006-08-01

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S757020

Reexamination Certificate

active

07084654

ABSTRACT:
A system and method are disclosed for clamping test probes to the test pads of a flexible printed circuit of a head gimbal assembly. A two-step contact method is used to prevent electro-static damage. The clamp is made of a dissipative material, as is the test probe housing. A spring-loaded slider block in the test probe housing allows the clamp to make contact with the test pads before the test pads are brought into contact with the test probes. The dissipative material of the clamp and the housing allows the electrical potential of the test pads and the electrical potential of the test probes to be equalized before the two are brought into contact with each other.

REFERENCES:
patent: 5795172 (1998-08-01), Shahriari et al.
patent: 6208155 (2001-03-01), Barabi et al.
patent: 6483716 (2002-11-01), Shin
PUCAST OY ESD-Materials Oct. 29, 2001.

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