X-ray tomography inspection systems

Details X-ray tomography inspection systems X-ray tomography inspection systems

2011-01-25

2011-01-25

Glick, Edward J (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Absorption

Reexamination Certificate

active

07876879

ABSTRACT:
An X-ray imaging inspection system for inspecting items comprises an X-ray source (10) extending around an imaging volume (16), and defining a plurality of source points (14) from which X-rays can be directed through the imaging volume. An X-ray detector array (12) also extends around the imaging volume (16) and is arranged to detect X-rays from the source points which have passed through the imaging volume, and to produce output signals dependent on the detected X-rays. A conveyor (20) is arranged to convey the items through the imaging volume (16).

REFERENCES:
patent: 5600700 (1997-02-01), Krug et al.
patent: 6707879 (2004-03-01), McClelland et al.
patent: 7103137 (2006-09-01), Seppi et al.
patent: 7139406 (2006-11-01), McClelland et al.
patent: 7183906 (2007-02-01), Zanovitch et al.
patent: 7369640 (2008-05-01), Seppi et al.
patent: 7492855 (2009-02-01), Hopkins et al.
patent: 7734066 (2010-06-01), DeLia et al.
patent: 2003/0085163 (2003-05-01), Chan et al.
patent: 2004/0017888 (2004-01-01), Seppi et al.
patent: 2004/0101098 (2004-05-01), Bijjani et al.
patent: 2004/0120454 (2004-06-01), Ellenbogen et al.
patent: 2005/0031075 (2005-02-01), Hopkins et al.
patent: 2005/0111610 (2005-05-01), De Man et al.
patent: 2005/0169422 (2005-08-01), Ellenbogen
patent: 2005/0169423 (2005-08-01), Ellenbogen et al.
patent: 2007/0003003 (2007-01-01), Seppi et al.
patent: 2007/0053495 (2007-03-01), Morton et al.
patent: 2003254124 (2004-02-01), None
patent: 1626039 (2005-06-01), None
patent: 1795527 (2006-06-01), None
patent: 102004056590 (2005-06-01), None
patent: 0873511 (1998-10-01), None
patent: 1540318 (2005-06-01), None
patent: 1618584 (2006-01-01), None
patent: 1689640 (2006-08-01), None
patent: 2418529 (2006-03-01), None
patent: 2005177469 (2005-07-01), None
patent: 1027596 (2005-11-01), None
patent: WO 97/18462 (1997-05-01), None
patent: WO 2004/010127 (2004-01-01), None
patent: WO 2004/097889 (2004-11-01), None
patent: WO 2005/017566 (2005-02-01), None
patent: WO 2005/050405 (2005-06-01), None
PCT International Search Report (PCT/GB2006/004684), Feb. 23, 2007, CXR Ltd.

Affiliated with

Also associated with

Rating

X-ray tomography inspection systems does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with X-ray tomography inspection systems, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-ray tomography inspection systems will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2652194