X-ray target and apparatuses using the same

X-ray or gamma ray systems or devices – Source – Target

Reexamination Certificate

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C378S043000

Reexamination Certificate

active

07551722

ABSTRACT:
Disclosed are an X-ray target having a micro focus size and capable of producing X-rays of high intensity, and apparatuses using such an X-ray target. The X-ray target (1) has a structure in which a first cap layer (21), a target layer (22), and a second cap layer (23) are successively laminated, wherein the first and second cap layers (21and23) are each composed of a material which is lower in electron beam absorptivity than that of which the target layer (22) is composed. An X-ray generator using the X-ray target (1) can generate highly intense and nanofocus (several nm) X-rays (17). Using the X-ray generator, an X-ray microscope allows obtaining a high resolution transmission image, an X-ray diffraction apparatus allows obtaining an X-ray diffraction image of a very small area, and a fluorescent X-ray analysis apparatus allows making the fluorescent X-ray analysis of a minute area.

REFERENCES:
patent: 6850598 (2005-02-01), Fryda et al.
patent: 2003/0086533 (2003-05-01), Janik et al.
patent: 2006/0133576 (2006-06-01), Wilkins et al.
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patent: 2002-313266 (2002-10-01), None
Translation of International Preliminary Report on Patentability mailed Mar. 1, 2007 of International Application No. PCT/JP2005/007279.
J. Harada et al.; “Ultra-fine Radiography based on Micro X-ray Source”; Japan Society of Photography, vol. 65, No. 7, pp. 495-500, 2002.
S. W. Wilkins et al.; “Phase-contrast imaging using polychromatic hard X-rays”; Nature, vol. 384, pp. 335-338, Nov. 28, 1996.
International search report of PCT/JP2005/007279, date of mailing Aug. 2, 2005.

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