X-ray or gamma ray systems or devices – Source – Electron tube
Reexamination Certificate
2007-10-05
2010-10-05
Song, Hoon (Department: 2882)
X-ray or gamma ray systems or devices
Source
Electron tube
C378S140000, C378S143000
Reexamination Certificate
active
07809113
ABSTRACT:
The present invention relates to an X-ray source for emitting a characteristic X-ray and a fluorescent X-ray analyzing apparatus using the X-ray source. A secondary target is arranged in superposition on a primary target. An electron beam generated by an electron gun enters the primary target, which passes and emits a continuous X-ray. The secondary target transmits and emits a characteristic X-ray excited by the continuous X-ray emitted from the primary target. The primary target and the secondary target are superposed one on the other, so that the continuous X-ray emitted from the primary target efficiently excites the secondary target thereby to efficiently generate the characteristic X-ray.
REFERENCES:
patent: 3229089 (1966-01-01), Sasao
patent: 3963922 (1976-06-01), Zulliger et al.
patent: 4048496 (1977-09-01), Albert
patent: 4903287 (1990-02-01), Harding
patent: 5157704 (1992-10-01), Harding
patent: 6141400 (2000-10-01), Schardt et al.
patent: 2004/0218725 (2004-11-01), Radley et al.
patent: 2005/0226378 (2005-10-01), Cocks et al.
patent: 1190662 (2005-02-01), None
patent: 2001-008925 (2001-01-01), None
patent: 2001-155670 (2001-06-01), None
patent: 2004-28845 (2004-01-01), None
International Search Report dated May 1, 2007 for PCT/JP 2007/051710.
Chinese Office Action dated Sep. 18, 2009 for Appln. No. 200780000164.2.
Izumi Nakai ed., “Practical Applications of Fluorescent X-ray Analysis”, Published by Asakura Shoten, Oct. 20, 2005.
Izumi. Nakai, “Present Situation and Outlook of Fluorescent X-Ray Analysis”; Applied Physics, Vo. 74, No. 4, 2005, pp. 455-456.
Aoki Nobutada
Kakutani Akiko
Pillsbury Winthrop Shaw & Pittman LLP
Sanei Mona M
Song Hoon
Toshiba Electron Tubes & Devices Co., Ltd.
LandOfFree
X-ray source and fluorescent X-ray analyzing apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with X-ray source and fluorescent X-ray analyzing apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-ray source and fluorescent X-ray analyzing apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4206558