X-ray or gamma ray systems or devices – Beam control – Filter
Reexamination Certificate
2008-01-01
2008-01-01
Glick, Edward J. (Department: 2882)
X-ray or gamma ray systems or devices
Beam control
Filter
C378S159000, C378S157000, C378S156000
Reexamination Certificate
active
07315611
ABSTRACT:
An x-ray reflector may include: a substrate; a first layer formed on the substrate, the first layer including a relatively higher-Z material, where Z represents the atomic number; and a second layer formed on the first layer, the second layer including a relatively lower-Z material; at least one of the first layer and the second layer exhibiting a taper in an axial direction extending between a first end of the substrate and a second end of the substrate.
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Cho Yong Min
Fox Thomas Joseph
Glick Edward J.
Harness & Dickey & Pierce P.L.C.
Midkiff Anastasia S.
Monochromatic X-Ray Technologies, Inc.
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