X-ray radiography with highly charged ions

X-ray or gamma ray systems or devices – Source

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

378120, G21G 400

Patent

active

061154520

ABSTRACT:
An extremely small (1-250 micron FWHM) beam of slow highly charged ions deexciting on an x-ray production target generates x-ray monochromatic radiation that is passed through a specimen and detected for imaging. The resolution of the x-ray radiograms is improved and such detection is achieved with relatively low dosages of radiation passing through the specimen. An apparatus containing an electron beam ion trap (and modifications thereof) equipped with a focusing column serves as a source of ions that generate radiation projected onto an image detector. Electronic and other detectors are able to detect an increased amount of radiation per pixel than achieved by previous methods and apparati.

REFERENCES:
patent: 4287425 (1981-09-01), Elliott, Jr.
patent: 4887604 (1989-12-01), Shefer et al.
patent: 4929839 (1990-05-01), Parker et al.
patent: 5063294 (1991-11-01), Kawata et al.
patent: 5327475 (1994-07-01), Golovanivsky et al.
patent: 5398273 (1995-03-01), Jordan et al.
patent: 5528034 (1996-06-01), Yamazaki et al.
patent: 5596620 (1997-01-01), Canistraro et al.
patent: 5712483 (1998-01-01), Boone et al.
patent: 5849093 (1998-12-01), Andra
S. Rondot and J. Cazaux, "Quantitative mapping of species moving in solution by x-ray projection microscopy," Rev. Sci. Instrum. 68 (4), Apr. 1997, pp. 1787-1791.
C. Kunz, "X-Ray Microscopy," Physica Scripta. vol. T61, 1996, pp. 19-25.
Roscoe Marrs et al, "The Electron-Beam Ion Trap," Physics Today, Oct. 1994, pp. 27-34.
R. E. Marrs et al., Rev. Sci. Instrum. 69, 204 (1998).
B. D. Cullity, Elements of X-ray Diffraction (Reading, MA: Addison-Wesley, 1978), pp. 19-21.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

X-ray radiography with highly charged ions does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with X-ray radiography with highly charged ions, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-ray radiography with highly charged ions will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2220549

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.