X-ray particle size analyzer

Details X-ray particle size analyzer X-ray particle size analyzer

1988-10-26

1993-09-21

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Absorption

356246, 356441, G01N 2306

Patent

active

052475581

ABSTRACT:
An x-ray sedimentation particle size analyzer in which data is taken only at particular positions along the sedimentation cell, and each such position is individually calibrated. Presentation of the data in the form of a particle size distribution curve can be accomplished very accurately using interpolation techniques. The sedimentation cell design is free of the effects of undesirable density gradients, capable of detecting and removing bubbles, capable of attaining a highly uniform dispersion of sample prior to sedimentation, and including a safety interlock device for blocking x-ray projection when the cell is being accessed.

REFERENCES:
patent: 3449567 (1969-06-01), Olivier et al.
patent: 3621243 (1971-11-01), Olivier et al.
patent: 3839642 (1974-10-01), Shinnar
patent: 4282745 (1987-08-01), Burr
patent: 4853551 (1989-08-01), Wagner et al.
patent: 4920550 (1990-04-01), Olivier et al.

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