X-ray optical system with collimator in the focus of an...

X-ray or gamma ray systems or devices – Beam control – Collimator

Reexamination Certificate

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C378S082000, C378S043000, C378S071000, C378S084000

Reexamination Certificate

active

06898270

ABSTRACT:
An X-ray optical system with an X-ray source (Q) and a first graded multi-layer mirror (A), wherein the extension Qxof the X-ray source (Q) in an x direction perpendicular to the connecting line in the z direction between the X-ray source (Q) and the first graded multi-layer mirror (A) is larger than the region of acceptance (F) of the mirror (A) at a focus (Oa) of the mirror (A) in the x direction, is characterized in that a first collimator (bl) is disposed at a focus of the first graded multi-layer mirror (A) between the X-ray source (Q) and the mirror (A) whose opening in the x direction corresponds to the region of acceptance of the first graded multi-layer mirror (A) and the separation qzAbetween first collimator (bl) and X-ray source (Q) is:in-line-formulae description="In-line Formulae" end="lead"?qzA=Qx/tan αx,in-line-formulae description="In-line Formulae" end="tail"?wherein αxis the angle subtended by the first graded multi-layer mirror (A) in the x direction, as viewed from the first collimator (bl). This permits reduction of the disturbing radiation on the sample for constant useful X-radiation power from the source Q.

REFERENCES:
patent: 5042059 (1991-08-01), Watanabe et al.
patent: 5204887 (1993-04-01), Hayashida et al.
patent: 5274435 (1993-12-01), Hettrick
patent: 5524039 (1996-06-01), Kamon
patent: 5923720 (1999-07-01), Barton et al.
patent: WO 9522 758 (1995-08-01), None
patent: WO 9943 009 (1999-08-01), None
“X-RAY MICROSCOPY”, V.E. Cosslett et al., University Press, 1960, pp. 107-110.
“X-ray Microscope With Multilayer Mirrors”, Underwood et al., Applied Optics 25, No. 11, 1986.

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