X-ray, neutron or electron diffraction method using an imaging p

Details X-ray, neutron or electron diffraction method using an imaging p X-ray, neutron or electron diffraction method using an imaging p

1997-07-09

1999-08-10

Hannaher, Constantine

Radiant energy

Source with recording detector

Using a stimulable phosphor

378 40, 378 90, 209589, G01N 23207

Patent

active

059362553

ABSTRACT:
An X-ray, neutron or electron diffraction method, which is devoid of the defects of conventional diffraction apparatus using an imaging plate, which can analyzing a sample, in a non-destructive mode without contact and with a good S/N ratio, even when the sample significantly generates fluorescence or scattered X-rays. The method includes the steps of irradiating a predetermined area of the sample with an X-ray, neutron or electron beam whose axis is oriented at a fixed direction to obtain a diffraction ray, rotating the sample while maintaining the irradiated predetermined area substantially unchanged and while maintaining the angle between the axis of the X-ray, neutron or electron beam relative to the tangential plane of the predetermined area substantially unchanged, forming an image of the diffraction ray from the sample during the rotation of the sample through every predetermined angle using an imaging plate, reading a data of the image formed on the imaging plate to obtain an output data for each rotation of the sample through the predetermined angle, and processing the output data to obtain desired analysis information.

REFERENCES:
patent: 5003570 (1991-03-01), Whiting
patent: 5245648 (1993-09-01), Kinney et al.

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