X-ray microscope with switchable x-ray source

Details X-ray microscope with switchable x-ray source X-ray microscope with switchable x-ray source

2009-03-11

2010-10-12

Kiknadze, Irakli (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Absorption

Reexamination Certificate

active

07813475

ABSTRACT:
An x-ray imaging system uses a synchrotron radiation beam to acquire x-ray images and at least one integrated x-ray source. The system has an imaging system including sample stage controlled by linear translation stages, objective x-ray lens, and x-ray sensitive detector system, placed on a fixed optical table and a mechanical translation stage system to switch x-ray sources when synchrotron radiation beam is not available.

REFERENCES:
patent: 5590168 (1996-12-01), Iketaki
patent: 6526121 (2003-02-01), Hwu et al.

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