X-ray micro-tomography system optimized for high resolution,...

Details X-ray micro-tomography system optimized for high resolution,... X-ray micro-tomography system optimized for high resolution,...

2007-05-08

2007-05-08

Glick, Edward J. (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Tomography

C378S021000

Reexamination Certificate

active

11072635

ABSTRACT:
A projection x-ray imaging system that possibly utilizes a laboratory-based micro-focused x-ray source is disclosed. Techniques for optimizing the system for high quality, three dimensional image formation with tomographic imaging with the potential for high resolution and high throughput are described. It also concerns ways to optimize the system design to obtain improved image quality.

REFERENCES:
patent: 6104776 (2000-08-01), Oikawa
patent: 7099432 (2006-08-01), Ichihara et al.
patent: 2003/0068010 (2003-04-01), Lentfer

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