X-ray measuring apparatus

Details X-ray measuring apparatus X-ray measuring apparatus

2005-05-17

2005-05-17

Church, Craig E. (Department: 2882)

X-ray or gamma ray systems or devices

Beam control

Antiscatter grid

C378S155000, C378S147000, C378S098800

Reexamination Certificate

active

06895080

ABSTRACT:
The present invention provides an x-ray measuring apparatus for diagnosis having high spatial resolution and high sensitivity, which includes: an x-ray source for emitting x-rays from an x-ray focal spot; an x-ray detector in which a plurality of sensing elements each having a sensitive part and a blind part surrounding the sensitive part are arranged two-dimensionally; data processing means for collecting output signals of the sensing elements and performing data processing; and an anti-scatter grid disposed between the x-ray focal spot and the x-ray detector with predetermined distance from the position of the x-ray focal spot and in which an x-ray transmitting member and an x-ray shielding member are alternately arranged in a first direction. A pitch in the first direction of linear images projected on a sensing surface of the x-ray detector of the x-ray shielding member by the x-ray is set to be substantially an integral multiple of two or larger of the pitch of arrangement of the sensing elements in the first direction. In such a manner, a moiré-free image of a wide field of view is obtained.

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Image Engineering: Shin Hasegasa, Corona Publishing Co., Ltd., pp 195-199.
Journal of Optical Society of America, vol. 1(6) pp. 612-619, 1984 “Practical Cone-Beam Algorithm”.
Trend of Flat Panel Detector: Kiyonari Inamura, Video Information, vol. 31(4) pp 125-130.

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