Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
Patent
1989-05-26
1991-09-24
Bowers, Jr., Charles L.
Radiation imagery chemistry: process, composition, or product th
Radiation modifying product or process of making
Radiation mask
378 35, 430966, 430967, G03F 900
Patent
active
050513265
ABSTRACT:
A mask for X-ray lithography is produced by initially forming a thin layer of polycrystalline silicon on a silicon oxide containing substrate. A portion of the substrate at the periphery of the major surface opposite the silicon layer is masked. The exposed portion of the substrate is removed by an etchant that is selective for silicon oxide containing composition relative to silicon, e.g. aqueous HF. The resulting membrane of silicon on a peripheral region of silicon oxide containing compositions is in tensile stress as required for lithography, but is robust. Metal, X-ray absorbing patterns are formed on the silicon by standard lithographic procedures.
REFERENCES:
patent: 4451544 (1984-05-01), Kawabuchi
A. Heuberger, Journal of Vacuum Science and Technology, B6, 107 (1988).
J. P. Silverman, et al., Journal of Vacuum Science and Technology, B6 2147 (1988).
S. M. Sze, VLSI Technology, Second Edition, McGraw Hill Book Co., New York, 1988, pp. 238-248.
E. I. Bromley, et al., Journal of Vacuum Science Technology, B1, 1364 (1983).
Celler George K.
Trimble Lee E.
AT&T Bell Laboratories
Bowers Jr. Charles L.
Neville Thomas R.
Schneider B. S.
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