X-ray or gamma ray systems or devices – Specific application – Holography or interferometry
Reexamination Certificate
2007-06-28
2011-10-18
Song, Hoon (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Holography or interferometry
Reexamination Certificate
active
08041004
ABSTRACT:
An interferometer for x-rays, in particular hard x-rays, for obtaining quantitative x-ray images from an object, includes: a) an x-ray source, preferably a standard polychromatic x-ray source, b) a diffractive beam splitter grating other than a Bragg crystal, preferably in transmission geometry, c) a position-sensitive detector with spatially modulated detection sensitivity having a number of individual pixels; d) means for recording the images of the detector in a phase-stepping approach; and e) means for evaluating the intensities for each pixel in a series of images in order to identify the characteristic of the object for each individual pixel as an absorption dominated pixel and/or an differential phase contrast dominated pixel and/or an x-ray scattering dominated pixel.
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Pfeiffer et al: “Phase Retrieval and Differential Phase-Contrast Imaging with Low-Brilliance X-Ray Sources”, XP002422783, Nature Physics, Nature Publishing Group, Mar. 26, 2006, pp. 258-261, London, GB.
Weitkamp et al: “X-Ray Phase Imaging with a Grating Interferometer”, XP002397629, Optics Express, Optical Society of America, Aug. 8, 2005, pp. 6296-6304, vol. 13, No. 16, Washington, DC.
Momose et al: “Phase Tomography by X-Ray Talbot Interferometry for Biological Imaging”, XP002444795, Japanese Journal of Applied Physics, Jun. 2006, pp. 5254-5262, vol. 45, No. 6A.
David Christian
Pfeiffer Franz
Greenberg Laurence A.
Locher Ralph E.
Paul Scherrer Institut
Sanei Mona M
Song Hoon
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