X-ray inspection using spatially and spectrally tailored beams

Details X-ray inspection using spatially and spectrally tailored beams X-ray inspection using spatially and spectrally tailored beams

2006-03-07

2006-03-07

Glick, Edward J. (Department: 2882)

X-ray or gamma ray systems or devices

Beam control

Filter

C378S160000, C378S145000

Reexamination Certificate

active

07010094

ABSTRACT:
A system and method for inspecting an object, the system and method comprising a source for generating a penetrating radiation beam for irradiating the object, the beam having, for each instant of time, an instantaneous energy spectrum of intensity, a shaper for modulating the generated beam, thereby creating a shaped beam, the shaper comprising at least a first section and a second section, the first section attenuating the intensity of a portion of the generated beam by a first attenuation factor and the second section attenuating the intensity of another portion of the generated beam by a second attenuation factor, and at least one detector for detecting the shaped beam after the shaped beam interacts with the object. The source may scan a beam across an object while the source and at least one detector are moving on a platform capable of highway travel or on an inspection module movable with respect to the object.

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