X-ray or gamma ray systems or devices – Specific application – Tomography
Reexamination Certificate
2007-07-17
2007-07-17
Yun, Jurie (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Tomography
C378S058000, C378S207000
Reexamination Certificate
active
11145073
ABSTRACT:
An x-ray inspection system. The x-ray inspection system includes an x-ray source, an on-axis x-ray sensor, at least one off-axis x-ray sensor, a fixture, and an accumulation circuit. The on-axis x-ray sensor is configured to capture on-axis images of radiation from the x-ray source. The x-ray source is displaced from the on-axis x-ray sensor, and the x-ray source and the on-axis x-ray sensor are positioned on an axis conceptually drawn between the x-ray source and the on-axis x-ray sensor. At least one off-axis x-ray sensor is configured to capture off-axis images of radiation from the x-ray source, wherein each off-axis x-ray sensor is positioned off the axis. The fixture is configured to maintain an article between the x-ray source and the on-axis and off-axis x-ray sensors, and the accumulation circuit is configured to receive and accumulate images captured by the on-axis and off-axis x-ray sensors.
REFERENCES:
patent: 4516261 (1985-05-01), Harding et al.
patent: 6748046 (2004-06-01), Thayer
patent: 6940942 (2005-09-01), Ullberg
patent: 7123684 (2006-10-01), Jing et al.
patent: 2004/0184576 (2004-09-01), Meyer
Buck Dean C.
Eliasson Tracy
Kerschner Ronald K.
Turner Anthony C.
Agilent Technologie,s Inc.
Yun Jurie
LandOfFree
X-ray inspection system having on-axis and off-axis sensors does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with X-ray inspection system having on-axis and off-axis sensors, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-ray inspection system having on-axis and off-axis sensors will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3818029