X-ray inspection system and method

Details X-ray inspection system and method X-ray inspection system and method

1994-12-16

1996-04-09

Porta, David P.

X-ray or gamma ray systems or devices

Electronic circuit

With display or signaling

378 62, 378207, 36441313, H05G 164

Patent

active

055068804

ABSTRACT:
An x-ray system and method capable of producing very accurate RTR images corrected for x-ray system inhomogeneities. A three-dimensional correction memory is used to store deviation information relating to system inhomogeneities. The three-dimensional correction memory is indexed by x and y coordinates of the image plane and an attenuation coordinate associated with a plurality of standard samples. The standard samples are exposed in turn, and deviations between the measured attenuation and the nominal attenuation are noted and stored at the x and y coordinates in the attenuation plane for the sample then exposed. The procedure is repeated for a plurality of samples to create a three-dimensional correction array. An object to be imaged creates a set of raw intensity information. The raw information is corrected by accessing the correction memory at the x and y coordinates of each pixel to be corrected and the attenuation coordinate associated with the raw measurement. The deviation information is applied to the raw measurement to produce and store a corrected attenuation factor for each pixel.

REFERENCES:
patent: 4789930 (1988-12-01), Sones et al.
patent: 5123037 (1992-06-01), Picard et al.
patent: 5434902 (1995-07-01), Bruijns

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