X-ray inspection system

Details X-ray inspection system X-ray inspection system

2008-07-15

2008-07-15

Thomas, Courtney (Department: 2882)

X-ray or gamma ray systems or devices

Beam control

Scanner

C378S057000, C378S098800

Reexamination Certificate

active

11536254

ABSTRACT:
An x-ray inspection system (198) arranged to inspect at least one object and comprising: a source of radiation (200) a detector (216), in use, capable of detecting the radiation passing through an irradiation zone (214) and generating a periodic output of data therefrom; processing circuitry arranged to process the output generated by the detector (216); a speed determination means (228) arranged, in use, to determine and output to the processing circuitry the speed at which an object passes the detector (216); wherein the processing circuitry is arranged to vary the period of the output of the detector (216) according to the output from the speed determination means (228).

REFERENCES:
patent: 4736401 (1988-04-01), Donges et al.
patent: 2004/0251415 (2004-12-01), Verbinski et al.
patent: 0198276 (1986-10-01), None
patent: 2004257884 (2004-09-01), None

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