X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate
2008-04-08
2008-04-08
Glick, Edward J. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Absorption
C378S098200
Reexamination Certificate
active
11020038
ABSTRACT:
The X-ray inspection system10comprises an X-ray electron conversion face42for converting an entered X-ray image transmitted through the measurement object into an electronic image, an output fluorescent face46for emitting fluorescence when an electronic image is entered, and deflecting means44which is installed between the X-ray electron conversion face42and output fluorescent face46, wherein the electronic image which was entered and converted at the X-ray electron conversion face42is converged into a predetermined area on the output fluorescent face46by the deflecting means44so as to make the X-ray fluoroscopic image of the moving measurement object stand still on the output fluorescent face46. By this, the image of the measurement object can be captured during the time when the X-ray fluorescence image is standing still, so sensitivity can be secured while increasing the resolution.
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Mori Hiroshige
Suzuki Makoto
Yonezawa Tomikazu
Drinker Biddle & Reath LLP
Glick Edward J.
Hamamatsu Photonics K.K.
Midkiff Anastasia S.
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