Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2008-08-12
2011-10-04
Stafira, Michael P (Department: 2886)
Image analysis
Applications
Manufacturing or product inspection
C382S144000, C382S145000
Reexamination Certificate
active
08031929
ABSTRACT:
According to one embodiment, a method for processing one or more X-ray images includes: receiving at least one image of the one or more X-ray images, the one or more X-ray images being of an assembly extending along a plane; based on the at least one image, autonomously determining a respective displacement value for each of portions of the assembly with respect to one or more directions of the plane, each of the displacement values being determined relative to a respective actual value; storing the displacement values; and applying a rule to the stored displacement values, the rule being for determining a defect status of the assembly.
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International Search Report and Written Opinion for Application No. PCT/US2008/076965 mailed on Apr. 17, 2009.
Hamblin Michael W.
Reichert Peter A.
Srinivasan Govindarajan T.
Wrinn Joseph F.
Stafira Michael P
Teradyne, Inc.
Wolf Greenfield & Sacks P.C.
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