X-ray inspection of solder reflow in high-density printed...

Image analysis – Applications – Manufacturing or product inspection

Reexamination Certificate

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C382S144000, C382S145000

Reexamination Certificate

active

08031929

ABSTRACT:
According to one embodiment, a method for processing one or more X-ray images includes: receiving at least one image of the one or more X-ray images, the one or more X-ray images being of an assembly extending along a plane; based on the at least one image, autonomously determining a respective displacement value for each of portions of the assembly with respect to one or more directions of the plane, each of the displacement values being determined relative to a respective actual value; storing the displacement values; and applying a rule to the stored displacement values, the rule being for determining a defect status of the assembly.

REFERENCES:
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patent: 5268954 (1993-12-01), Middleton
patent: 5481585 (1996-01-01), Kimura et al.
patent: 5621811 (1997-04-01), Roder et al.
patent: 6748046 (2004-06-01), Thayer
patent: 6748378 (2004-06-01), Lavender et al.
patent: 6917668 (2005-07-01), Griffith
patent: 7013038 (2006-03-01), Patnaik
patent: 2007/0122020 (2007-05-01), Claus
International Search Report and Written Opinion for Application No. PCT/US2008/076965 mailed on Apr. 17, 2009.

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