X-ray or gamma ray systems or devices – Accessory – Testing or calibration
Reexamination Certificate
2011-07-19
2011-07-19
Yun, Jurie (Department: 2882)
X-ray or gamma ray systems or devices
Accessory
Testing or calibration
C378S057000, C378S062000
Reexamination Certificate
active
07980760
ABSTRACT:
An X-ray inspection apparatus detects, by an X-ray line sensor, X-rays irradiated towards a product placed on a conveyor and transmitted therethrough in order to detect the presence of foreign matter contained in the product. The X-ray inspection apparatus includes a determination unit and a calibrating unit. The determination unit is configured to determine, based on detection results by a line sensor obtained at each of prescribed positions of the conveyor, whether each of the prescribed positions of the conveyor is an appropriate position for calibrating the line sensor. The calibrating unit is configured to calibrate the line sensor based on detection results obtained by the line sensor at a position that is determined by the determination unit to be the appropriate position for calibrating the line sensor.
REFERENCES:
patent: H03-116299 (1991-05-01), None
patent: H10-339707 (1998-12-01), None
patent: 2001-004560 (2001-01-01), None
patent: 2005-091016 (2005-04-01), None
patent: 2005-351794 (2005-12-01), None
patent: 2006-071423 (2006-03-01), None
patent: 2006-170652 (2006-06-01), None
Iwai Atsushi
Kabumoto Takashi
Global IP Counselors, LLP
Ishida Co. Ltd.
Yun Jurie
LandOfFree
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