X-ray inspection apparatus and X-ray inspection method

Details X-ray inspection apparatus and X-ray inspection method X-ray inspection apparatus and X-ray inspection method

2006-08-29

2006-08-29

Glick, Edward J. (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Tomography

C378S021000, C378S208000

Reexamination Certificate

active

07099432

ABSTRACT:
The X-ray inspection device and the X-ray inspection method according to the present invention are configured to hold an object to be inspected irradiated with an X-ray from an X-ray irradiation device, uses a swinging device for performing swinging motion of tilting the object to be inspected at an arbitrary angle and in an arbitrary direction, images the X-ray that passes through the object to be inspected in an X-ray detection device and extracts data of a desired cross section from the X-ray image of the X-ray detection device in a control device.

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patent: 5848115 (1998-12-01), Little et al.
patent: 6628746 (2003-09-01), Eppler et al.
patent: 6687328 (2004-02-01), Bavendiek et al.
patent: 59-116040 (1984-07-01), None
patent: 11-344453 (1999-12-01), None
patent: 2002-189002 (2002-07-01), None

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