X-ray inspection apparatus

Details X-ray inspection apparatus X-ray inspection apparatus

2007-08-21

2007-08-21

Yun, Jurie (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Absorption

C378S058000, C250S359100, C382S141000, C382S283000

Reexamination Certificate

active

11379375

ABSTRACT:
An X-ray inspection apparatus is disclosed. An inside area defining unit defines an area inside the rim of the can in an X-ray image created by an image formation unit. An extension area defining unit rotates a circle such that the circle externally touches the above-mentioned area, and defines an extension area whose boundary is the locus of the center of the externally touching circle. A reduction area defining unit rotates a circle having the same radius such that it internally touches the extension area, and defines a reduction area whose boundary is the locus of the center of the internally touching circle. A mask area defining unit defines a region outside the boundary of the reduction area as a mask area, and the first contaminant detection unit performs an inspection for contamination in an inspection area inside the mask area defined by an inspection area defining unit.

REFERENCES:
patent: 3917947 (1975-11-01), Fenton
patent: 5202932 (1993-04-01), Cambier et al.
patent: 63/236989 (1988-10-01), None
patent: 2001/281173 (2001-10-01), None

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