X-ray inspection apparatus

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

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Details

378901, 36441316, G01N 2302, G06F 1542

Patent

active

048037117

ABSTRACT:
An X-ray inspection apparatus is provided with main detectors each for detecting the absorption amount of X-ray beams delivered from an X-ray focal point, a reference detector for detecting variations in the size or position of the X-ray focal point, and means for removing errors due to influence of the X-ray focal point variations, based on the detention result of the reference detector.

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