X-ray imaging particularly adapted for low Z materials

Details X-ray imaging particularly adapted for low Z materials X-ray imaging particularly adapted for low Z materials

1991-12-18

1994-05-17

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 57, 378 90, G01N 23201

Patent

active

053135113

ABSTRACT:
An imaging device for increasing the ability to recognize, in x-ray produced images, materials of low atomic number. A flying spot scanner illuminates an object to be imaged in a raster pattern; the flying spot repeatedly sweeps a line in space, and the object to be imaged is moved so that the illuminating beam intersects the object. At least a pair of x-ray detectors are employed, each pair associated with signal processing apparatus and a display. The two detectors employed (and the associated electrons and display) are selected from a set of three which includes a transmitted detector located at the line in space which is repeatedly traversed by the pencil beam, a forward scatter detector which is located further from the x-ray beam than the object to respond to photons scattered by the object being illuminated out of the path of the beam, and a back scatter detector which is located closer to the x-ray source than the object being imaged and also arranged to detect photons scattered out of the beam path by the object. In another embodiment of the invention all three detectors and their associated electronics/displays are employed.

REFERENCES:
patent: 3780291 (1973-12-01), Stein et al.
patent: 4123654 (1978-10-01), Reiss et al.
Kawatra et al., "The On-Line Measurements of Ash in Coal Slurries", Can. J. Spectrosc., vol. 21, No. 2, Mar./Apr. 1976, pp. 58-60.

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