Thermal measuring and testing – Temperature measurement – Temperature distribution or profile
Reexamination Certificate
2000-11-17
2001-06-26
Gutierrez, Diego (Department: 2859)
Thermal measuring and testing
Temperature measurement
Temperature distribution or profile
C374S120000, C374S190000, C374S201000, C600S426000, C600S427000
Reexamination Certificate
active
06250800
ABSTRACT:
DETAILED DESCRIPTION
The invention—especially useful in cancer therapy—comprises implanted thermometers having a fluid moving from a bulb along a channel to a fluid length, the fluid length—thus the temperature of the bulb—being determined by x-ray imaging.
The invention provides progress over prior art as shown for example in U.S. Pat. Nos. 1,199,121 by Siebert, 3,548,308 by Seabury, 3,893,111 by Cotter, 4,138,998 by Nowogrodzki, 4,561,054 by Andrews, 4,613,757 by Deserno, 4,947,247 by Farver, 5,109,853 by Taicher, 5,983,123 by Shmulewitz, and in Japanese patent documents 58-17326 by Konishi and 58-169040 by Nakada.
REFERENCES:
patent: 1199121 (1916-09-01), Siebert
patent: 3548308 (1970-12-01), Seabury
patent: 3631721 (1972-01-01), Nollen et al.
patent: 3893111 (1975-07-01), Cotter
patent: 4138998 (1979-02-01), Nowogrodzki
patent: 4469451 (1984-09-01), Kunetka et al.
patent: 4561054 (1985-12-01), Andrews et al.
patent: 4613757 (1986-09-01), Deserno et al.
patent: 4947247 (1990-08-01), Farver
patent: 5109853 (1992-05-01), Taicher
patent: 5285785 (1994-02-01), Meyer
patent: 5394457 (1995-02-01), Leibinger et al.
patent: 5396889 (1995-03-01), Ueda et al.
patent: 5967982 (1999-10-01), Barnett
patent: 5983123 (1999-11-01), Shmulewitz
patent: 6097994 (2000-08-01), Navab et al.
patent: 3335129 (1985-04-01), None
patent: 0672384 (1995-09-01), None
patent: 54-130079 (1979-10-01), None
patent: 58-17326 (1983-02-01), None
patent: 58-169040 (1983-10-01), None
patent: 04164212 (1990-10-01), None
Gutierrez Diego
Moyer Don
Pruchnic Jr. Stanley J.
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