X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1982-12-09
1985-08-06
Church, Craig E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 79, 128303B, 269328, A61G 1300, A61B 1700
Patent
active
045340501
ABSTRACT:
An X-ray goniometer is provided which comprises, a pair of wooden endplates held in a parallel, adjustably spaced relationship by a plurality of connecting dowel rods, a rotatable support mounted to each endplate, each support being rotatable about a common axis perpendicular to the endplates, for supporting each end of the specimen, and means to position the supports in any given angular orientation about the axis. Means may be included to adjust the spacing between endplates and between each support and the axis.
REFERENCES:
patent: 2035952 (1936-03-01), Ettinger
patent: 2508449 (1950-05-01), Davis, Jr. et al.
patent: 2568191 (1951-09-01), Grimm
patent: 3262452 (1966-07-01), Hardy et al.
patent: 3384086 (1966-01-01), Rocha-Miranda
patent: 3466439 (1969-09-01), Setala
patent: 3655178 (1972-04-01), Vezina
patent: 3859982 (1975-01-01), Dove
patent: 4360028 (1982-11-01), Barbier
Church Craig E.
Scearce Bobby D.
Singer Donald J.
The United States of America as represented by the Secretary of
Wieland Charles
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