X-ray or gamma ray systems or devices – Specific application – Fluorescence
Reexamination Certificate
2007-10-30
2007-10-30
Glick, Edward J. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Fluorescence
C378S042000, C378S048000, C378S096000
Reexamination Certificate
active
11264403
ABSTRACT:
The change in the sample size and a change in background intensity due to the coexisting element are measured in real time to thereby automatically change a measurement time, the detection lower limit is kept constant, so that a fluorescent X-ray apparatus is provided that is capable of measuring every time in the same detection lower limit even in a case where there have existed a change in size of a sample, a change in sensitivity due to a difference in main ingredient, and a change of a magnitude in background due to an influence of a coexisting element.
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Japanese Office Action dated Jun. 12, 2007.
Brinks Hofer Gilson & Lione
Glick Edward J.
Midkiff Anastasia S.
SII Nano Technology Inc.
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