X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent
1986-02-24
1989-08-22
Church, Craig E.
X-ray or gamma ray systems or devices
Specific application
Fluorescence
378148, 378160, G01B 1502
Patent
active
048603295
ABSTRACT:
An X-ray fluorescence thickness measuring devise includes a primary X-ray beam collimation and workpiece positioning system that markedly increases the detectable fluorescent X-radiation from diverse specimen calibration standards and workpieces subjected to measurement. The positioning system includes an optical viewing system that provides a video signal image of the specimen surface prior to and during specimen radiation without hazard to the unit operator and independent of the collimator bore selected. A further feature of the measuring device is that it includes a system which assures repetitive and accurate positioning of a selected collimator relative to the axis of the X-ray beam to obtain maximum beam transmission therethrough.
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Zimmerman, "X-Ray Measurement of Plating Thickness", 3/61, p. 10 of American Jewelry Manufacturer.
Zimmerman, "Industrial Applications of X-Ray Methods for Measuring Plating Thickness", 3/61, p. 27 of Quality Assurance.
Finer Paul
Landau Zvi
Pincus Cary I.
Silverman William
Weiser Murray
Church Craig E.
UPA Technology, Inc.
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