X-ray fluorescence spectrometer and program used therein

Details X-ray fluorescence spectrometer and program used therein X-ray fluorescence spectrometer and program used therein

2007-03-06

2007-03-06

Glick, Edward J. (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Fluorescence

C378S046000

Reexamination Certificate

active

11431604

ABSTRACT:
A calculating device10for calculating the concentration of elements contained in a sample13based on the FP method is provided. The calculating device10is operable to assume a concentration of unmeasured elements as far as unmeasured elements, of which fluorescent X-rays are not measured, are concerned, and, also, to utilize, in place of the secondary X-rays emanating from the unmeasured elements contained in the sample, scattered X-rays of the primary X-rays at least equal in number to the number of the unmeasured elements, of which concentrations are assumed, and including scattered X-rays of different wavelengths before they are scattered from the sample.

REFERENCES:
patent: 4764945 (1988-08-01), Abe
patent: 6314158 (2001-11-01), Shiota et al.
patent: 6668038 (2003-12-01), Kataoka et al.
patent: 2004-251785 (2004-09-01), None

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