X-ray fluorescence spectrometer and program for use therewith

Details X-ray fluorescence spectrometer and program for use therewith X-ray fluorescence spectrometer and program for use therewith

2006-10-17

2008-11-11

Kao, Chih-Cheng G (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Fluorescence

C378S050000

Reexamination Certificate

active

07450685

ABSTRACT:
A scanning X-ray fluorescence spectrometer includes a quantitatively analyzing device (18) which calculates the concentration of hexavalent chrome based on the fact that the peak spectroscopic angle, at which the maximum intensity is attained in Cr—Kα line (22), changes depending on the ratio of the concentration of the hexavalent chrome vs. the concentration of the intensity of the total chrome. A plurality of detecting device (23) having different resolutions as a combination of a divergence slit (11), a spectroscopic device (6), a receiving slit (20) and a detector (8) is provided such that when the change of the peak spectroscopic angle is to be detected, a detecting device (23B) having a higher resolution than that of the detecting device (23A), which is selected when the concentration or the intensity of the total chrome is to be determined, is selected.

REFERENCES:
patent: 5067111 (1991-11-01), Asano et al.
Chemical State Analysis of Sulfur, Chromium and Tin by High Resolution x-Ray Spectrometry; Gohshi, et al., Advances in X-ray Analysis, vol. 18, 1975, pp. 406-414.
Limit I in chemical Condition Analyzing Method Using Two Crystal-Type High Resolution Fluorescent X-ray Technology; Asahi Kasei Analysis & Simulation; May 24, 2003.

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