X-ray fluorescence spectrometer

Details X-ray fluorescence spectrometer X-ray fluorescence spectrometer

1976-09-17

1978-05-23

Borchelt, Archie R.

Radiant energy

Ionic separation or analysis

With sample supply means

250272, 250277CH, G21K 106

Patent

active

040912825

ABSTRACT:
Disclosure is made of an X-ray fluorescence spectrometer comprising an X-ray source, a holder of a sample being investigated, an analyzing crystal which focuses the fluorescent radiation of the sample installed in the holder, and a detector which records the radiation reflected from the analyzing crystal. The distance between the X-ray source and the sample holder is such as to ensure an illumination of the central portion of the sample's surface not less than 15Z erg/s.multidot.cm.sup.2 .multidot.W, wherein Z defines the atomic weight of the X-ray anode, at a voltge of 50 kV across the X-ray source. The sample holder is so arranged with respect to the focal circle that the distance between the latter and the sample's surface exposed to radiation is not in excess of the product of the distance between the source's focus and the sample's surface exposed to radiation by the ratio between the diameter of the focal circle and the length of the analyzing crystal.

REFERENCES:
patent: 2805341 (1957-09-01), Lang
patent: 2805343 (1957-09-01), Lang
patent: 3514599 (1970-05-01), Campbell

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