X-ray fluorescence measuring system making use of polarized exci

X-ray or gamma ray systems or devices – Source – Target

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378144, H01J 3508

Patent

active

060495898

ABSTRACT:
The invention relates to X-ray fluorescence measuring systems, more specifically to methods for producing polarized X-radiation. The invention is based on the idea of using beryllium as the anode material despite its poor effectiveness. Some of the X-radiation spectrum produced by a beryllium anode is polarized radiation, more specifically its high-energy portion. The system of the invention involves filtering out the low-energy portion of the spectrum, whereby the remaining intensely polarized radiation can be used as excitation radiation in X-ray fluorescence measurements. The system of the invention is capable of achieving a certain intensity of polarized X-radiation by means of an X-ray tube less powerful than those used in common prior art solutions based on the use of scattering media.

REFERENCES:
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patent: 3944822 (1976-03-01), Dzubay
patent: 4637042 (1987-01-01), Braun
patent: 4799250 (1989-01-01), Penato et al.
G. Pavlovskaya etal., "Source of Nanosecond Soft X-Ray Pulses," Instruments and Experimental Techniques, vol. 17, No. 5, pp. 1478-1480 (1975).

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