X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent
1998-04-06
2000-02-08
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Fluorescence
378 85, G01N 2300
Patent
active
060234962
ABSTRACT:
An X-ray fluorescence analyzing apparatus is formed of an X-ray tube, plural X-ray spectroscopes disposed around a line linking between the X-ray tube and a place where a sample is placed, and first and second slit plates. The first slit plate has at least one first slit therein and is situated at an incident side of the X-ray spectroscopes. The second slit plate has at least one second slit therein, and is situated at an ejection side of the X-ray spectroscopes. X-rays radiated from the X-ray tube enter into the predetermined X-ray spectroscope through the first slit plate and then pass through the second slit plate, so that a sample is irradiated by predetermined X-ray wavelengths. The sample can be radiated by different X-ray wavelengths by selecting the slits of the first and second slit plates.
REFERENCES:
patent: 3160749 (1964-12-01), Spielberg
patent: 3898455 (1975-08-01), Furnas, Jr.
patent: 4134012 (1979-01-01), Smallbone et al.
patent: 4599741 (1986-07-01), Wittry
patent: 5132997 (1992-07-01), Kojima et al.
patent: 5199057 (1993-03-01), Tamura et al.
patent: 5204887 (1993-04-01), Hayashida et al.
patent: 5579363 (1996-11-01), Ingal et al.
Dunn Drew A.
Porta David P.
Shimadzu Corporation
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