X-ray examination system with identification of and compensation

Details X-ray examination system with identification of and compensation X-ray examination system with identification of and compensation

1996-06-25

1997-09-09

Wong, Don

X-ray or gamma ray systems or devices

Specific application

Computerized tomography

378 9811, 378 9812, H05G 160

Patent

active

056663919

ABSTRACT:
An x-ray examination apparatus with a detector array having a number of detector elements includes a data correction computer in which the subject-scattered radiation can be numerically determined and corrected. The forward scatter intensity is determined by multiplication of the measured intensities, windowed with a window function, with the natural logarithm of the intensity normalized with the unattenuated primary intensity. The subject-scattered radiation can then be calculated and corrected through filtering of the forward scatter intensity with a convolution kernel and a suitable scaling.

REFERENCES:
patent: 4114041 (1978-09-01), Oliver
patent: 4203036 (1980-05-01), Tschunt
patent: 4812983 (1989-03-01), Gullberg et al.

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