X-ray examination apparatus with an imaging arrangement having a

Details X-ray examination apparatus with an imaging arrangement having a X-ray examination apparatus with an imaging arrangement having a

1993-08-18

1995-05-02

Porta, David P.

X-ray or gamma ray systems or devices

Electronic circuit

With display or signaling

378 988, 2504871, H04N 100

Patent

active

054127050

ABSTRACT:
An x-ray examination apparatus includes an imaging arrangement, devised for performing fluoroscopy. Which has image sensors that are efficiently optically coupled with an x-ray sensitive radiation conversion screen. Consequently, the image sensors produce an electrical signal having a high signal-to-noise ration when low doses of x-radiation are administered. An x-ray conversion screen is provided with a tapetum filter so as to concentrate light in the forward direction. Furthermore, the x-ray conversion screen is preferably fitted with a light reflecting layer for reflecting light that has been reflected by the tapetum filter, said light reflecting layer being transparent for x-radiation. Further concentration of light in the forward direction is achieved by placing a light-transparent material having a suitable refractive index between the radiation conversion screen and lenses that concentrate the light onto the image sensors. Semiconductor image sensors in the form of charge-coupled devices are provided for converting a visible image into an electronic video signal. In order to improve the effectiveness of the CCDs, weak avalanching is applied so as to increase both sensitivity and signal-to-noise ratio of the sensors.

REFERENCES:
patent: 3944835 (1976-03-01), Vosburgh
patent: 4479061 (1984-10-01), Koizumi et al.
patent: 4503460 (1985-03-01), Sklebitz
patent: 5235191 (1993-08-01), Miller
"Experimental Observation of Avalanche Multiplication in Charge-Coupled Devices" Madan et al, IEEE Trans. on Electron Devices, vol. ED-30, No. 6 Jun. 1983, pp. 694-699.

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