X-ray examination apparatus with a semiconductor x-ray detector

Details X-ray examination apparatus with a semiconductor x-ray detector X-ray examination apparatus with a semiconductor x-ray detector

1997-07-08

1999-05-18

Porta, David P.

X-ray or gamma ray systems or devices

Electronic circuit

With display or signaling

378 983, H04N5/00

Patent

active

059057726

ABSTRACT:
An x-ray examination apparatus includes an x-ray source for emitting x-rays and an x-ray detector for deriving an image signal from an x-ray image. The x-ray detector has a semiconductor element including one or several sensor elements. Further the x-ray examination apparatus is provided with a bias radiation source for irradiating the x-ray detector with electromagnetic radiation. In particular, the x-ray detector is an x-ray sensor matrix having a multitude of semiconductor sensor elements. Preferably the bias radiation source is arranged to emit infrared radiation.

REFERENCES:
patent: 4359759 (1982-11-01), McBride et al.
patent: 4737653 (1988-04-01), Nakagawa et al.
patent: 5541974 (1996-07-01), Sklebitz
patent: 5757884 (1998-05-01), Alexandrescu

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