X-ray examination apparatus including a matrix of sensors and de

Radiant energy – Invisible radiant energy responsive electric signalling – Semiconductor system

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25037009, G01T 102, G01T 124

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051947366

ABSTRACT:
An X-ray examination apparatus includes a sensor matrix (41) with sensors (1) which are arranged in rows and columns and each of which comprises an X-ray sensitive photosensor element (11) and a storage capacitance (12) which is connected parallel thereto. First electrodes of the sensors are connected to a counter-electrode (2) which receives a direct voltage, second electrodes being connected to an electric switch (13) provided for each sensor. For exposure measurement the currents flowing through the counter-electrode (electrodes) (2) and/or the electric switches (13) after the brief closing of the electric switches (13) and before the reading of the charges are used to measure and/or correct the exposure of groups of the sensors during the execution of an X-ray exposure.

REFERENCES:
patent: 3995161 (1976-11-01), Lux
patent: 4689487 (1987-08-01), Nishiki et al.
patent: 4747118 (1988-05-01), Spaak
patent: 5079426 (1992-01-01), Antonuk et al.
J. P. Doty et al, "Design of Low Noise, High Performance X-ray Charge-Coupled-Device Cameras", Optical Engineering, Oct. 1987, vol. 26, No. 10, pp. 1055-1060.

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