X-ray examination apparatus comprising an exposure control circu

Details X-ray examination apparatus comprising an exposure control circu X-ray examination apparatus comprising an exposure control circu

1995-12-22

1997-09-02

Porta, David P.

X-ray or gamma ray systems or devices

Electronic circuit

With display or signaling

378 95, 378112, H05G 164

Patent

active

056640005

ABSTRACT:
An X-ray examination apparatus includes an exposure control circuit (20) which supplies a control signal for adjustment of the X-ray source (1). The exposure control circuit (20) determines the control signal from an area of the X-ray image in which no overexposure occurs. To this end, the exposure control circuit includes a selection unit (23) for determining a measuring part from an electronic image signal, formed from the X-ray image by means of an X-ray detector (5, 8, 7), by comparing the signal level of the electronic image signal with an upper limit value which is dependent on the setting of the X-ray apparatus, for example of the high voltage and the anode current of the X-ray source. The upper limit value preferably amounts to the difference between the overexposure level and a safety margin. The safety margin serves to render the exposure control circuit insensitive to small fluctuations of the intensity and energy of the X-ray beam (3) generated by the X-ray source (1).

REFERENCES:
patent: 4562586 (1985-12-01), Honda et al.
patent: 4868651 (1989-09-01), Chou et al.
patent: 4982418 (1991-01-01), Kuehnel
patent: 5012504 (1991-04-01), McFaul et al.
patent: 5029338 (1991-07-01), Aichinger et al.
patent: 5144646 (1992-09-01), Gerlach
patent: 5287396 (1994-02-01), Stegehuis
patent: 5388138 (1995-02-01), Fujiwara
patent: 5485501 (1996-01-01), Aichinger

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