X-ray or gamma ray systems or devices – Beam control – Filter
Patent
1996-07-12
1998-05-12
Porta, David P.
X-ray or gamma ray systems or devices
Beam control
Filter
378158, G21K 300
Patent
active
057517860
ABSTRACT:
An X-ray examination apparatus (1) includes a filter (4) which is arranged between the X-ray source (2) and the X-ray detector (3). The X-ray filter includes a large number of filter elements (5); the X-ray absorptivity of the filter elements can be adjusted by controlling the quantity of X-ray absorbing liquid (6) than individual filter elements. The filter elements are formed by metal capillary tubes or the wall of the capillary tubes, or the wall of the capillary tubes is provided with a metal layer (7). On the metal layer there is provided a dielectric layer (8) and the dielectric layer is covered by a coating layer (9). The dielectric layer is, for example a glass, parylene or polystyrene layer. The coating layer is, for example a Teflon, silane or siloxane layer. The dielectric layer can be dispensed with when a Teflon coating layer is used.
REFERENCES:
patent: 4701021 (1987-10-01), Le Pesant et al.
Welters Wilhelmus J. J.
Wijdenes Jacob
Porta David P.
Slobod Jack D.
U.S. Philips Corporation
LandOfFree
X-ray examination apparatus comprising a filter does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with X-ray examination apparatus comprising a filter, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-ray examination apparatus comprising a filter will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-991032